Metrology Service

Gain precise insights into your materials and components with PVA TePla’s advanced Metrology Service. We deliver high‑resolution, non‑destructive characterization to support research, process optimization, and quality assurance in the semiconductor and advanced materials sectors.

We collaborate with customers to create custom measurement strategies, tailored test protocols, and clear evaluation procedures. Our application laboratory handles a broad range of materials, including Si, GaAs, GaN, SiC, and InP — and wafer sizes up to 450 mm.

All measurements include professional graphical evaluations and detailed test reports. With advanced software tools and customer‑specific evaluation schemes, we ensure consistent, quantitative, and comparable results.