Hyperspectral Vision

Comprehending the invisible
PVA's Hyperspectral Vision technology offers a comprehensive, non-destructive, and fast inspection of layers, thin films and surfaces.
 

Inspection for layer deposition
(Large area) manufacturing processes of thin films in industry require a precise control of e.g. film thickness, homogeneity, chemical compositions, crystallinity and surface roughness. In order to determine these properties in real time, Hyperspectral Vision is a novel, cost-efficient, and fast tool as in-line technology for large-area quality control. 

 

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Inspection for layer and surface modification

Coating and surface modifications are of crucial importance in the industry as they add new functionalities to a surface in a very cost-efficient way. This must be accompanied by accurate monitoring of process parameters and modification results. Hyperspectral Vision provides comprehensive insights into the surface condition (e.g. wettability, degree of adsorption, phase composition, penetration depth).

Inspection for Surface Cleaning

The cleanliness of surfaces has a major influence on the overall success of a manufacturing process and the reject rate. Only Hyperspectral Vision can provide comprehensive and non-destructive/non-contact knowledge of residues from manufacturing processes or after cleaning steps. Time-consuming single point measurements (e. g. XPS, AES) can be replaced and quality inspection is accelerated.

How does it works?

Hyperspectral Vision comprehends the invisible:

PVA's hardware captures data in a data structure called ‚hypercube', enabling a fast and non-destructive inspection of the entire sample. The software then screens and explores the data using advanced machine learning algorithms, delivering actionable insights directly to the user.

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Relevant industries

Semiconductor

PVA’s technology allows a wafer inspection in less than 10 seconds, providing spatially resolved data on layer thicknesses from 2 nm to 300 µm, contamination levels and surface properties. As an optics-based technology, it is suitable for use on production wafers. PVA‘s Hyperspectral Vision technology offers a fast, contactless, and comprehensive inspection of semiconductor integration or PCBs assembly quality. It provides spatially-resolved data i. e. on solder paste residuals as well as oils and greases, and surface conditions like oxidation states.

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Energy

PVA's Hyperspectral Vision technology offers a fast, contactless, and comprehensive inspection of the anti-corrosion layer on bipolar plates. It provides spatially-resolved data on layer thickness, homogeneity, and defects across the entire bipolar plate.

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Aerospace & Defense

PVA's Hyperspectral Vision technology enables fast, contactless, and comprehensive quality inspection for aerospace and defence components. It delivers spatially-resolved data i. e. on protective coating integrity and thin film thickness on turbine blades, surface contaminations on bonding areas, as well as oxidation states and material composition of structural alloys.

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Medical

PVA's Hyperspectral Vision technology enables fast, contactless, and comprehensive quality inspection for medical devices and components. It delivers spatially-resolved data i. e. on biocompatible coating thickness and uniformity on implants, residual contaminations from manufacturing processes, as well as surface cleanliness verification of surgical instruments.

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Comprehensive Surface Analysis

PVA's technology empowers manufacturers with end-to-end Hyperspectral Vision systems to ensure quality, functionality, and cost-efficiency in industrial processes. 

Fast
PVA’s systems capture surface properties, contaminations and deviations from production specifications comprehensive and fast (mean measurement time less than 10 s) instead of time-consuming single-point measurements.

Comprehensive
PVA’s systems boosts the information content by orders of magnitude compared to your single-point measurements and random sampling like FT-IR, GD-OES, TEM/SEM, LIBS, X-ray, Contact-angle or AFM measurements with just one comprehensive measurement (full sample, 100 %)

Non-destructive
PVA’s systems are a unique combination of optical spectroscopy and imaging to objectively assess the entire sample surface non-destructively.

All Hyperspectral Vision system solutions will be tailored to your needs with the AI-equipped software VEsolve® pro.

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Hyperspectral Vision

FAQs

What is required to use PVA's solutions?

To connect a VEpioneer® or VEreveal solution, an Ethernet (standard RJ45) and power connection is required. All solutions can be operated by almost anyone without prior knowledge. If required, PVA also offers advice for further training and support.

How expensive are PVA's solutions?

The cost of our solution varies based on the specific needs and requirements of each customer. Generally, the VEpioneer® as our standardized bench-top solution is available at a lower price than the in-line module solution VEreveal. For a personalised quote, please contact us with your project details.

How does PVA's software output the results?

VEsolve® is user-centred. On the one hand, the customer has all the options for data preparation and model creation with VEpioneer®. On the other hand, the operator mode together with the VEreveal solution helps to effectively decide whether a good or bad part has been analyzed. In addition, the results can be saved as complete hypercubes, but figures, tables and images can also be extracted.

In what (spatial) resolution are samples measured by VEpioneer® / VEreveal?

Normally, our bench-top VEpioneer® solution is designed for 300 µm spatial resolution. However, this is part of the customisation we offer for an optimally adapted solution. 

Can I get a VEpioneer® sample stage for my specific needs?

The sample stage is adjusted to the customer's needs each time. Our product data sheets with detailed technical specifications are available for download on the webpages of the respective solutions.

How fast does the VEpioneer® / VEreveal capture data from a sample?

Within seconds, e.g. the VEpioneer® scans a 300 x 300 mm sample in 20 seconds.  However, the acquisition speed for the VEreveal solution is adapted to the manufacturing process and sample sizes. Using predefined machine learning models, the results of the inspection are displayed immediately in our VEsolve® Pro software. 

Hyperspectral vision technology at a glance

VEpioneer

The VEpioneer® series offers the world’s first fully integrated one-button bench-top Hyperspectral Vision system for macroscopic or microscopic inspection. It captures surface properties, detects thin films and identifies deviations from production specifications.

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VEreveal

The VEreveal® series offers inline Hyperspectral Vision systems for semiconductor fab environments. Capable of macroscopic inspection, microscopic inspection, or both combined, the systems capture surface properties, detect contaminations, and identify deviations in production, replacing multiple conventional measurement methods in one.

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VEgauge

VEgauge® features PVA’s unique Hyperspectral Vision technology for continuous macroscopic or microscopic inline inspection. It efficiently captures surface properties, detects thin films, and identifies deviations from production specifications.

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VEsolve software

VEsolve software

VEsolve® pro is the powerful all-in-one software suite designed for PVA’s Hyperspectral Vision technology, comprising acquisition, screening and exploration of Hyperspectral Vision data.

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