Contactless Monocrystal Growth for Material Evaluation
Small polycrystalline samples from the production process are inductively melted in an argon atmosphere and crystallized on a seed into a monocrystal. This is then analyzed using spectrometric methods. This allows the quality of the produced polysilicon to be determined and documented. Due to contactless melting – the high ultimate vacuum generated by a turbomolecular pump and the use of ultra-pure argon as the process atmosphere – contamination during the process is effectively prevented.
In the FZ-14MG version, silicon granulate can be placed below the coil and, using a seed crystal at the upper feed, monocrystals for material analysis can be pulled in a process with reversed pulling direction. For this purpose, the upper spindle can be moved in both X and Y directions.
| Crystal pulling length | 350 mm |
| Crystal diameter | up to 25 mm |
| Final vacuum | 2.5 x 10-5 mbar |
| Max. overpressure | 2 bar (g) |
| Material: Silicon |
| Height | 3,000 mm |
| Width | 1,020 mm |
| Depth | 1,640 mm |
| Footprint (total) | 1,800 mm x 4,000 mm |
| Weight (total) | Approx. 2,500 kg |
Interested in FZ-14M?